Reliability Testing of Semiconductors

While developing a semiconductor product, there are various aspects and features of the semiconductor that are validated by the semiconductor engineers. To help you comprehend the importance of reliability testing as well as product reliability, here is an exhaustive discussion on reliability testing.

Semiconductor reliability, which is a key to delivering a quality product to the users, is one such aspect that is verified and validated by the team with the assistance of accelerated life testing.

What is Reliability Testing?

Reliability testing incorporates the results from both functional and non-functional testing, such as stress testing, thermal testing, functionality testing, production testing and more, which enables the team to determine various problems in the semiconductor design and functionality.

Semiconductor reliability testing is an important semiconductor testing technique that is performed by the team to ensure that the semiconductor is performing and functioning consistently in the given environmental conditions by using halt testing to for various calculations such as MTBF (meantime between failure) and utilizing burn-in to to speed up the accelerated life testing.

Objectives of Reliability Testing

  • To test the performance of semiconductor under a particular condition is the main the objective of Reliability testing.
  • To discover the perceptual structure of repetitive breakdown.
  • To locate the mean existence of the semiconductor.
  • To find the primary driver of failure.
  • To find the numbers of failures, that occurs in a predetermined measure of time.
  • Checking the execution of various units of programming in the wake of taking preventive actions.